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A62.4503
Atomic Force Microscope
 
A62.4501
Atomic Force Microscope
 
A62.4701
Scanning Probe Microscope
 
A61.4701
Scanning Tunneling Microscope
 
A61.4601
Scanning Tunneling Microscope
 
A61.4501
Scanning Tunnel Microscope
Home >> Optical Instrument >> Scanning Probe Microscope >> Scanning Probe Microscope

A62.4701 Scanning Probe Microscope
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  Features:
A62.4701 Scanning Probe Microscope, Not only can characterize sample’s surface structure and property, but also can detect the sample’s inside structure and property at nano-scale below the surface;
Scanning Tunneling Microscope(STM), Atomic Force Microscope(AFM)
 
  Detail Specification:
Specification
A62.4701 Scanning Probe Microscope
Feature


Not only can characterize sample’s surface structure and property, but also can detect the sample’s inside structure and property at nano-scale below the surface;

Scanning system

1, Standard function modulesScanning Tunneling Microscope(STM), Atomic Force Microscope(AFM) which include contact, sliding, tapping, phase and raise mode, Nanomilling function, Thickness(film)/Height(Step) measurement function, Nano-positioning technology(CCD+ High precision X-Y sample moving platform + Large range adaptive-scanner);

2, Super curve measurement modeCan set up all of the AD as Y signal, all the DA as X signal, such as I-V curve, I-Z curve, Force - the distance curve, Amplitude - the distance curve, Frequency - phase curve, Phase - the distance curve and Frequency - amplitude curve;

3, Thickness(film)/Height(Step) measurement functionImitate professional step measuring instrument, can achieve the film thickness/step height measurement quickly and easily;

4, Nanomilling functionEtching patterns(Electricity etching/ Force etching),Etching track(Vector etching/ Graphics etching);

5, Scanner rangeXYZ):50μm*50μm *8μm.We exclusively provide a 50-micron-range scanner which can achieve atomic-scale resolution by using one single scanner(unique core technology).(if Can choose matching the scanner of 100μm *100μm *8μm if you need);

6, The resolution of the 50/100μ scanner
STM:0.1nm X-Y axes; 0.01nm Z axis,Verified by HOPG;
Contact Mode AFM:0.2nm X-Y axes; 0.03nm Z axis,Verified by Mica lattice;
Tapping Mode AFM:0.2nm X-Y axes; 0.1nm Z axis,Verified by DNA;
SPAM:<10nm.

7, Sample platform sizeDiameter≤Φ70mmm,Thickness≤30mm.;

Nano-positioning technology

High precision X-Y sample moving platform:The high precision X-Y sample moving platform is controlled by computer automatically,and the platform can position the tested region of the sample to the below of the probe easily and accurately!
The moving range:5mm×5mm, the moving precision:50nm,The whole positioning process is monitored with CCD, in the protection of system security, while controls samples precise positioning.

a. Using the mouse to drag the test zone to the destination directly, and the computer controls the moving platform move automatically;
b. Can set the starting point arbitrarily, and a key to return(the computer controls the moving platform to back to the starting point)
c. Can sign many test zones , and write code for the positioning path, the computer controls the moving platform to move to all the test zones automatically;

Input the mobile value of the X, Y directly , and the computer controls the moving platform position automatically.

Electronic Control System

the center controller32-bit ARM technology, 16 M RAM, 2M Flash ROM;

8, Control / acquisition accuracyUse dual 16 AD / DA differential synchronous independent hyperbaric enlarge technical,16-channel dual 16-bit A / D; 12-channel 16-bit D / A; 4-channel dual 16-bit D / A ,Integrated digital phase-locked amplification and direct digital frequency synthesis technology;

9, Feedback mode:8-channel digital feedback + NC Simulationfeedback;

10, High voltage unitWhen add ±300V Voltage the ripple noise is just 1.5mV;4-channel dual 16-bit D / A provides the control voltage in three directions of XYZ , Can be expanded to 8-channel;

11, Scan angleCan adjust from -180°to +180°continuously;

12, The interfaces between the computers and the controllers :USB2.0;

13, The tunnel current1pA to 50nA;

14, Temperature and humidity sensing system:with real-time environment monitor and display features,Precision:Temperature 0.1°C,Humidity 0.5%RH.
Software system

15, Four-window image interface, Can simultaneously observe four different data channels imaging simultaneously, the image and all the current working environment parameters are restored simultaneously;

16, System intelligent memorization and self-taught functionOnce one parameter varies, the relevant parameters will on basis of system experience be adjusted automatically to the best scope without manual interference;

17, On-line piezoelectric ceramic nonlinear correction, Curved surface fitting correction, sample tip-tilt correction, the final measurement result: Non-linearity <1%,Orthogonality less than 1%. Moreover, we also consider the scanning speed on the impact of non-linearity;

18, Arbitrary profile analysis functionCan set curve arbitrarily in the image, get this curve’s profile image;

19, Image processing software: three-dimensional image display,Image filtering,Image modification,Edge enhancement, Morphology Processing, Image format variation,Image geometric transformations, Palette set etc;

20, Data analysis softwareRoughness analysis,Particle size analysis,Profile Analysis,The film's thickness analysis ,Date Statistics, friction analysis, The analysis and comparison of the Bearing, The analysis and comparison of the power spectrum, Autocorrelation / cross-correlation analysis, The addition and subtraction function of the image, Various curve statistics / analysis etc;

21, Software development templateUser-friendly for the second development, the completion of a special data-processing functions;

22, Software service packsoftware functions irrelevant to hardware can enjoy free upgrading service for life;

23, Support the remote firmware download technology, Can directly download and upgrade the code in the programmable electronic devices;
Remote control software:Support for remote network control. Suppliers can remotely control the equipment in different places, do remote maintenance, remote training, remote experimental service and so on.

24, Remote control softwareSupport for remote network control. Suppliers can remotely control the equipment in different places, do remote maintenance, remote training, remote experimental service and so on.

Optional Function Modules
Item No.

In addition, there are several other function modules available for choosing, such as Friction force microscope, Magnetic force microscope, Electrostatic force microscope, Conductive atomic force microscope, Liquid atomic force microscope, Scanning Kelvin probe microscope, Scanning capacitance microscope, Sample heating platform, Force feedback device. The following are the module brief introduction and the price, If necessary, be free to choose!

The friction force Microscope The original scan mode of continue to change the positive pressure,the original dichotomize scan mode. Can quantitatively evaluate the tribological properties of thin film materials under very light load(10-7~10-9 N), and measure micro-friction coefficient;Can accurately position the angle between the cantilever tip and the scanning direction; Can simultaneously measure the changing of the lateral force In the F-Z measurements. A62.4701-1
The magnetic force microscope

Able to obtain the sample’s surface structure image and its corresponding magnetic domain structure at the nano-scale, the resolution is 50nm,and will verified by the magnetic domain structure of the Hard drive or DV.

A62.4701-2
The electrostatic force microscope Able to obtain the sample’s surface structure image and its corresponding electric field distribution at the nano-scale A62.4701-3
The conductive atomic force microscope Able to obtain the sample’s surface structure image and its corresponding current image at the nano-scale. Can obtain the I-V curve information and so on though the bias voltage modulation. A62.4701-4
The liquid atomic force microscope Configuring the liquid environmental probe device and the liquid intelligence probe shelf to achieve the function of the liquid atomic force microscope. Only need to insert the liquid intelligence probe shelf , system can automatically identify the present probe type, and software and hardware will automatically switch to the according working mode without manual interference. A62.4701-5
The scanning Kelvin probe microscope Imposing two types voltage of DC and AC between the tip and sample, using the Lock-amplification technology can get the change of the sample’s surface work function and the sample’s surface structure image. A62.4701-6
The scanning capacitance microscope Using voltage modulation technique to detect small changes of the sample’s surface capacitance. A62.4701-7
The sample heating platform

 Can control the sample’s temperature from the room temperature to 150 ℃,and the precision is 0.5 ℃. The unique design of the sample’s cooling system can make the temperature control more rapidly and accurately. The diameter of the sample stage is 30mm. Choosing the low temperature coefficient alloy material,and the insulation designing, can constrain the drift phenomenon influences on the imaging quality.

A62.4701-8
The force feedback device  A tool that can intuitively feel the interaction force between the tip and the sample in the course of the SPM operation. The force feedback device can directly mapped the pN to nN-class power, and the nano to micro-class movement to a physical space which can be feeled, touched, and manipulated. You can feel the adhesion, the reunion, the attraction, and the exclusion between nano-particles, can feel the obdurability of the Nano-fiber and the spiral adsorption of the DNA, you also can move, manipulate, accumulate, and order the sample’s various surface sediments. A62.4701-9

 


 

 
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