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A50.7011
Ion Sputtering Coater
 
A63.7081
Scanning Electron Microscope Pro FEG SEM
 
A63.7080
Scanning Electron Microscope Std FEG SEM
 
A63.7069
Scanning Electron Microscope Std SEM
 
A63.7062
Scanning Electron Microscope Eco SEM
Home >> Optical Instrument >> Scanning Probe Microscope >> Scanning Electron Microscope

A63.7069 Scanning Electron Microscope Std SEM
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  Features:
 
  Detail Specification:
A63.7069 Std Tungsten Filament SEM
Resolution 3nm@30KV(SE); 6nm@30KV(BSE)
Magnification Negative Magnification: 6x~300000x; Screen Magnification: 12x~600000x
Electron Gun Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge
Accelerating Voltage 0~30KV
Lens System Three-level Electromagnetic Lens (Tapered Lens)
Objective Aperture Molybdenum Aperture Adjustable Outside Vacuum System
Specimen Stage Five Axes Stage
Travel Range X(Auto)

0~80mm

Y(Auto)

0~60mm

Z(Manual)

0~50mm

R(Manual)

360o

T(Manual)

-5o~90o

Max Specimen Diameter

175mm

Detector

High Vacuum Secondary Electron Detector (With Detector Protection)

Modification

Stage Upgrade;EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser

Accessories

CCD,LaB6,X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine

Vacuum System

Turbo Molecular Pumps;Rotation Pump

Electron Beam Current 10pA~0.1μA
PC Customized Dell Work Station

 


 

 
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